Journal of Electrical & Electronic Systems

Md. Sultan Z

Publications

• Research Article
  Analysis of Reflectance and Transmittance Characteristics of Optical Thin Film for Various Film Materials, Thicknesses and Substrates
  Author(s): Md. Sultan Z and Sultana NMd. Sultan Z and Sultana N
  
  Optical thin film can control the reflection, refraction and transmission of specific wavelength of electromagnetic radiation and have numerous applications such as reflector, anti-reflector, attenuator, photovoltaic cell and refractor in the electromagnetic radiation spectrum. To perform the particular function for which they are designed, precise control of various film parameters such as thickness, composition, roughness, uniformity is necessary. Silicon dioxide, Zinc oxide, Zinc telluride are the most promising materials in optoelectronic and optical applications in the visible region as well as in the infrared and UV region. In this research, the optical properties such as spectral reflectance and transmittance of nano-scale optical thin films have been studied and analyzed for those materials on different substrates to obtain the optimal configuration for the best performance. T.. Read More»
  DOI: 10.4172/2332-0796.1000160

  Abstract PDF