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Journal of Electrical & Electronic Systems

ISSN: 2332-0796

Open Access

A Reliability Analysis of Metallized Film Capacitors Used for EMI Filtering

Abstract

Arturs Viksna*

Because of their high voltage capability and open circuit failure mode, metallized film capacitors are used to reduce electromagnetic interference (EMI) in electric power mains. This paper provides an in-depth examination of metallized film capacitors used for EMI filtering, as well as their failure modes and mechanisms. Corrosion of the metallized film due to moisture ingress into the package is one of the major failure mechanisms discussed. Standards for metallized film capacitor safety, quality, and reliability are also discussed. The paper concludes with recommendations for film capacitor selection, qualification, and accelerated life testing to ensure long-term reliability.

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