Modern tools for analyzing morphology and nano-mechanical properties of polymers

International Conference on Polymer Science & Engineering

August 22-24, 2016 New Orleans, USA

Matt Thompson and Stefan B Kaemmer

JPK Instruments, USA

Scientific Tracks Abstracts: J Material Sci Eng

Abstract :

From studies of the behavior of single molecules to simple measurements of the roughness of a coating, Atomic Force Microscopy (AFM) has proven itself to be an indispensable tool for polymer research. The ability to visualize structural information, nano-mechanical and other properties with nanometer resolution in a wide variety of media allows for the correlation with performance data. The NanoWizard family of AFMs is unique in that it combines key attributes commonly considered mutually exclusive: Fast Imaging Speed, Quantitative Imaging (QI) of nanomechanical and electrical properties, the combination with high resolution optics, and ease-of-use. Image acquisition times of a few seconds per frame allow for studying dynamic processes like dewetting or crystallization dynamics at temperatures up to 300 C. A variety of fluid and environmental cells enables measurements in controlled environments to simulate e.g. physiological conditions, which is an important step in testing stages of drug delivery systems. QI data reveal mechanical information like modulus and adhesion maps as well as rheology information. The underlying modes of operating the AFM will be explained in a comprehensive fashion and illustrated with application examples.

Biography :

Matt Thompson is JPK’s Sales Manager for the Eastern United States. He has over 25 years of experience with Atomic Force Microscopy and related techniques. His background includes instrument development, applications, marketing, product management and sales.

Email: thompson@jpk.com