Department of Materials Science and Engineering, University of California, Los Angeles, USA
Perspective
Multimodal AFM: Combining Topography, Conductivity and Mechanical Mapping in a Single Scan
Author(s): Sanjivan Nayak*
DOI:
10.37421/2572-0813.2025.10.285
Journal of Nanosciences: Current Research received 387 citations as per Google Scholar report
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